| Authors: | M. Zenari, M. Buffolo, M. Fornasier, C. De Santi, J. Goyvaerts, A.Grabowski, J. Gustavsson, S. Kumari, A. Stassren, R. Baets, A. Larsson, G. Roelkens, G. Meneghesso, E. Zanoni, M. Meneghini | | Title: | Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits | | Format: | International Journal | | Publication date: | 6/2023 | | Journal/Conference/Book: | IEEE Journal of Quantum Electronics
| | Volume(Issue): | 59(4) p.article 2400210 (10 pages) | | DOI: | 10.1109/JQE.2023.3283514 | | Citations: | 4 (Dimensions.ai - last update: 24/11/2024)
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