| Authors: | A. Diaz Tormo , D. Khalenkow, A. G. Skirtach, N. Le Thomas | | Title: | 4π Microscopy Immune to Sample-Induced Dephasing | | Format: | International Conference Proceedings | | Publication date: | 10/2018 | | Journal/Conference/Book: | IEEE Photonics Conference (IPC2018)
| | Editor/Publisher: | IEEE, | | Volume(Issue): | p.1-2 | | Location: | Reston, Virginia, United States | | DOI: | 10.1109/IPCon.2018.8527189 | | Citations: | Look up on Google Scholar
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Abstract
In 4π microscopy it is commonly assumed that the point spread function is unaffected by the sample, a big assumption considering that cell studies have reported sample-induced phase changes of more than a wavelength. Here we describe a method that does away with that assumption. Related Research Topics
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